@conference {70,
	title = {Sample Spaces and Feature Models: There and Back Again},
	booktitle = {12th International Software Product Line Conference (SPLC 2008)},
	year = {2008},
	pages = {22 - 31},
	publisher = {IEEE},
	organization = {IEEE},
	address = {Limerick, Ireland},
	abstract = {We  present  probabilistic  feature  models  (PFMs) and illustrate their
use  by  discussing modeling, mining and interactive configuration. PFMs
are  formalized  as  a set of formulas in a certain probabilistic logic.
Such  formulas  can  express  both  hard and soft constraints and have a
well   defined   semantics  by  denoting  a  set  of  joint  probability
distributions  over  features.  We  show  how  PFMs  can be mined from a
given  set  of  feature  configurations  using  data  mining techniques.
Finally,  we  demonstrate how PFMs can be used in configuration in order
to  provide  automated support for choice propagation based on both hard
and  soft  constraints.  We  believe that these results constitute solid
foundations for   the  construction  of  reverse  engineering  tools  for
software product lines and configurators using soft constraints.},
	isbn = {978-0-7695-3303-2},
	doi = {10.1109/SPLC.2008.49},
	url = {http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=\&arnumber=4626837},
	attachments = {http://gsd.uwaterloo.ca/sites/default/files/splc08.pdf , http://gsd.uwaterloo.ca/sites/default/files/splc08_slides.pdf},
	author = {Krzysztof Czarnecki and She, Steven and W{\k a}sowski, Andrzej}
}