@conference {70, title = {Sample Spaces and Feature Models: There and Back Again}, booktitle = {12th International Software Product Line Conference (SPLC 2008)}, year = {2008}, pages = {22 - 31}, publisher = {IEEE}, organization = {IEEE}, address = {Limerick, Ireland}, abstract = {We present probabilistic feature models (PFMs) and illustrate their use by discussing modeling, mining and interactive configuration. PFMs are formalized as a set of formulas in a certain probabilistic logic. Such formulas can express both hard and soft constraints and have a well defined semantics by denoting a set of joint probability distributions over features. We show how PFMs can be mined from a given set of feature configurations using data mining techniques. Finally, we demonstrate how PFMs can be used in configuration in order to provide automated support for choice propagation based on both hard and soft constraints. We believe that these results constitute solid foundations for the construction of reverse engineering tools for software product lines and configurators using soft constraints.}, isbn = {978-0-7695-3303-2}, doi = {10.1109/SPLC.2008.49}, url = {http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=\&arnumber=4626837}, attachments = {http://gsd.uwaterloo.ca/sites/default/files/splc08.pdf , http://gsd.uwaterloo.ca/sites/default/files/splc08_slides.pdf}, author = {Krzysztof Czarnecki and She, Steven and W{\k a}sowski, Andrzej} }